High resolution electron microscopy of GaAs capped GaSb nanostructures
نویسندگان
چکیده
S. I. Molina, A. M. Beltrán, T. Ben, P. L. Galindo, E. Guerrero, A. G. Taboada, J. M. Ripalda, and M. F. Chisholm Departamento de Ciencia de los Materiales e I. M. y Q. I., Facultad de Ciencias, Universidad de Cádiz, Campus Río San Pedro, s/n, Puerto Real, Cádiz 11510, Spain Departamento de Lenguajes y Sistemas Informáticos, CASEM, Universidad de Cádiz, Campus Río San Pedro, s/n, Puerto Real, Cádiz 11510, Spain Instituto de Microelectrónica de Madrid (CNM, CSIC), Isaac Newton 8, Tres Cantos, Madrid 28760, Spain Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
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تاریخ انتشار 2009